Preparation and characterization of dip coated cobalt oxide thin films

In this work, cobalt oxide thin films were prepared by sol-gel dip coating technique by varying the withdrawal speed of the substrate in the sol and their optical properties were analyzed, using the UV-vis spectrophotometer. The optical constants (n and k) for these films, in the 300-900 nm range an...

Full description

Saved in:
Bibliographic Details
Published inMaterials research innovations Vol. 23; no. 5; pp. 253 - 259
Main Authors Kayani, Zohra N., Shahzadi, Abida, Riaz, Saira, Naseem, Shahzad
Format Journal Article
LanguageEnglish
Published Taylor & Francis 29.07.2019
Subjects
Online AccessGet full text

Cover

Loading…
More Information
Summary:In this work, cobalt oxide thin films were prepared by sol-gel dip coating technique by varying the withdrawal speed of the substrate in the sol and their optical properties were analyzed, using the UV-vis spectrophotometer. The optical constants (n and k) for these films, in the 300-900 nm range and band gap of thin films are evaluated. FTIR confirmed formation of Co 3 O 4 thin films. X-ray diffraction showed polycrystalline films consisting of the Co 3 O 4 phase. Magnetic properties, such as saturation magnetization, remanence, coercivity and squareness ratio were evaluated from the hysteresis loop. Saturation magnetization was in the range of 16·26-114·30 emu/cm 3 and coercivity range was from 143·73-6·03 Oe.
ISSN:1432-8917
1433-075X
DOI:10.1080/14328917.2018.1449339