Scattering of 300 K effusive D2 beams from the H/Si(100) surface

Scattering of 300 K effusive D2 beam from H/Si(1 0 0) surfaces has been investigated in the dynamics experiments on angular and velocity distributions of scattered molecules. The results are compared with that of the He scattering which is governed mostly by the direct inelastic scattering (DIS). Al...

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Bibliographic Details
Published inSurface science Vol. 602; no. 8; pp. 1585 - 1588
Main Authors UENO, S, NARITA, Y, KHAN, A. R, KIHARA, Y, NAMIKI, A
Format Journal Article
LanguageEnglish
Published Lausanne Elsevier Science 15.04.2008
Amsterdam
New York, NY
Subjects
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Condensed matter: structure, mechanical and thermal properties
Cross-disciplinary physics: materials science; rheology
Exact sciences and technology
Physics
Helium atoms
Hydrogen
H-terminated Si surface
Velocity distribution
Helium
Inelastic scattering
Scattering dynamics
Angular distribution
Interaction potentials
Silicon
Angular velocity
Hydrogen molecules
Surface potential
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Summary:Scattering of 300 K effusive D2 beam from H/Si(1 0 0) surfaces has been investigated in the dynamics experiments on angular and velocity distributions of scattered molecules. The results are compared with that of the He scattering which is governed mostly by the direct inelastic scattering (DIS). Although the angular distribution of D2 molecules is nearly cosine but it includes considerable contribution of DIS. This may be explained in terms of the geometrical corrugation of D2-Si surface interaction potential.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:0039-6028
1879-2758
DOI:10.1016/j.susc.2008.02.018