Input offset compensation scheme with reduced sensitivity to charge injection and leakage

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Published in	Electronics letters Vol. 42; no. 6; pp. 340 - 341
Main Authors	RAMIREZ-ANGULO, J, GARIMELLA, A, GARIMELLA, L. M. K, LOPEZ-MARTIN, A. J, CARVAJAL, R. G
Format	Journal Article
Language	English
Published	London Institution of Electrical Engineers 16.03.2006
Subjects	Applied sciences Circuit properties Design. Technologies. Operation analysis. Testing Digital circuits Electric, optical and optoelectronic circuits Electronic circuits Electronics Exact sciences and technology Integrated circuits Integrated circuits by function (including memories and processors) Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Arithmetic circuit Integrated circuit testing Input signal Divider Integrated circuit
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Author	LOPEZ-MARTIN, A. J CARVAJAL, R. G RAMIREZ-ANGULO, J GARIMELLA, L. M. K GARIMELLA, A
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References	10.1049/el:20064320_r1 Ramírez-Angulo (10.1049/el:20064320_r3) 1995; 42 10.1049/el:20064320_r2 Ramírez-Angulo (10.1049/el:20064320_r4) 2001; 48
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SubjectTerms	Applied sciences Circuit properties Design. Technologies. Operation analysis. Testing Digital circuits Electric, optical and optoelectronic circuits Electronic circuits Electronics Exact sciences and technology Integrated circuits Integrated circuits by function (including memories and processors) Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Title	Input offset compensation scheme with reduced sensitivity to charge injection and leakage
Volume	42
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