Input offset compensation scheme with reduced sensitivity to charge injection and leakage

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Bibliographic Details
Published inElectronics letters Vol. 42; no. 6; pp. 340 - 341
Main Authors RAMIREZ-ANGULO, J, GARIMELLA, A, GARIMELLA, L. M. K, LOPEZ-MARTIN, A. J, CARVAJAL, R. G
Format Journal Article
LanguageEnglish
Published London Institution of Electrical Engineers 16.03.2006
Subjects
Applied sciences
Circuit properties
Design. Technologies. Operation analysis. Testing
Digital circuits
Electric, optical and optoelectronic circuits
Electronic circuits
Electronics
Exact sciences and technology
Integrated circuits
Integrated circuits by function (including memories and processors)
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Arithmetic circuit
Integrated circuit testing
Input signal
Divider
Integrated circuit
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More Information
ISSN:0013-5194
1350-911X
DOI:10.1049/el:20064320