Attenuation and Reflection of TEM and TE Microwaves Through a Dielectric With Multipactor

A theoretical model in terms of RF and electric field is proposed for the attenuation and reflection of TEM and TE microwaves through a dielectric with multipactor. The reflected power is much lower than the attenuated power. Also, both ratios of reflected and attenuated powers increase dramatically...

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Bibliographic Details
Published inIEEE transactions on electron devices Vol. 69; no. 8; pp. 4598 - 4603
Main Authors Wang, Huihui, Liu, Laqun, Liu, Dagang, Meng, Lin
Format Journal Article
LanguageEnglish
Published New York IEEE 01.08.2022
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subjects
Attenuation
Dielectrics
Electric fields
Electromagnetic particle-in-cell
Mathematical models
micro-wave attenuation
Microwave attenuation
microwave reflection
multipactor
Radio frequency
Saturation magnetization
Space charge
Surface treatment
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Summary:A theoretical model in terms of RF and electric field is proposed for the attenuation and reflection of TEM and TE microwaves through a dielectric with multipactor. The reflected power is much lower than the attenuated power. Also, both ratios of reflected and attenuated powers increase dramatically when the RF decreases to be near the cutoff frequency for TE microwaves. The attenuation ratio can be larger than 10% and smaller than 0.1%, while previously, it is usually considered as a small constant. The phenomena of power attenuation and reflection are also observed directly by electromagnetic particle-in-cell simulations, and simulation results are consistent with theoretical results.
ISSN:0018-9383
1557-9646
DOI:10.1109/TED.2022.3185182