Efficient test generation algorithm for path delay faults

A new algorithm has been developed to perform efficient delay testing. The algorithm enables applications of a new implication of value using indirect implication. The results of ISCAS benchmark circuits show the effectiveness of the new algorithm.

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Bibliographic Details
Published inElectronics letters Vol. 36; no. 1; pp. 13 - 14
Main Authors Kim, Myoung-Gyun, Kang, Sungho
Format Journal Article
LanguageEnglish
Published 06.01.2000
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