Evaluation and design optimization of piezoresistive gauge factor of thick-film resistors
On the basis of the analysis of all the thick-film design methodologies, the authors designed a test sample on which four different length-over-width ratios of resistors were designed. They found that the length-over-width ratio will substantially affect the gauge factor in some cases, in contrast t...
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Published in | IEEE Proceedings of the SOUTHEASTCON '91 pp. 1106 - 1109 vol. 2 |
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Main Authors | , , , , |
Format | Conference Proceeding |
Language | English |
Published |
IEEE
1991
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Subjects | |
Online Access | Get full text |
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Summary: | On the basis of the analysis of all the thick-film design methodologies, the authors designed a test sample on which four different length-over-width ratios of resistors were designed. They found that the length-over-width ratio will substantially affect the gauge factor in some cases, in contrast to prior research. This can be modeled to generate a linear predictive model, The sensors designed on the insulator and the sensors underneath the insulator were also studied in order to simulate the multilayer hybrid technology and study the effects of insulator-resistor-substrate surface interaction. It is demonstrated that design techniques can affect the strain sensitivity of thick-film resistors.< > |
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ISBN: | 9780780300330 0780300335 |
DOI: | 10.1109/SECON.1991.147935 |