Neuro-Space Mapping for Modeling Heterojunction Bipolar Transistor

A neuro-space mapping (Neuro-SM) for modeling heterojunction bipolar transistor (HBT) is presented, which can automatically modify the input signals of the given model by neural network. The novel Neuro-SM formulations for DC and small-signal simulation are proposed to obtain the mapping network. Si...

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Published inTransactions of Tianjin University Vol. 21; no. 1; pp. 90 - 94
Main Author 闫淑霞 成千福 邬海峰 张齐军
Format Journal Article
LanguageEnglish
Published Heidelberg Tianjin University 2015
School of Electronic Information Engineering, Tianjin University, Tianjin 300072, China
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ISSN1006-4982
1995-8196
DOI10.1007/s12209-015-2493-x

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Summary:A neuro-space mapping (Neuro-SM) for modeling heterojunction bipolar transistor (HBT) is presented, which can automatically modify the input signals of the given model by neural network. The novel Neuro-SM formulations for DC and small-signal simulation are proposed to obtain the mapping network. Simulation results show that the errors between Neuro-SM models and the accurate data are less than 1%, demonstrating that the accurcy of the proposed method is higher than those of the existing models.
Bibliography:A neuro-space mapping (Neuro-SM) for modeling heterojunction bipolar transistor (HBT) is presented, which can automatically modify the input signals of the given model by neural network. The novel Neuro-SM formulations for DC and small-signal simulation are proposed to obtain the mapping network. Simulation results show that the errors between Neuro-SM models and the accurate data are less than 1%, demonstrating that the accurcy of the proposed method is higher than those of the existing models.
heterojunction bipolar transistor (HBT) ; nonlinear device modeling; neural network; neuro-space mapping; optimization
12-1248/T
Yan Shuxia , Cheng Qianfu, Wu Haifeng , Zhang Qijun (1. School of Electronic Information Engineering, Tianjin University, Tianjin 300072, China; 2. Department of Electronics, Carleton University, K1ShB6, Canada)
ISSN:1006-4982
1995-8196
DOI:10.1007/s12209-015-2493-x