A model for the Auger electron spectroscopy of systems exhibiting layer growth, and its application to the deposition of silver on nickel

The dependence of Auger intensities on deposition time for deposits which grow in layer-by-layer fashion is analysed in terms of a simple model. It is shown that it is possible in principle to calibrate the Auger signals as a function of thickness absolutely with no prior assumption of values for st...

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Bibliographic Details
Published inSurface science Vol. 36; no. 2; pp. 381 - 394
Main Authors Jackson, D.C., Gallon, T.E., Chambers, A.
Format Journal Article
LanguageEnglish
Published Elsevier B.V 1973
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Summary:The dependence of Auger intensities on deposition time for deposits which grow in layer-by-layer fashion is analysed in terms of a simple model. It is shown that it is possible in principle to calibrate the Auger signals as a function of thickness absolutely with no prior assumption of values for sticking coefficients. The extent to which theory and experimental data for the deposition of silver on nickel are in agreement is examined, and values deduced for sticking coefficients and escape depths of Auger electrons in silver. It is also found that silver grows epitaxially on nickel at room temperature, and that silver/nickel bicrystals do not alloy after heat treatment.
ISSN:0039-6028
1879-2758
DOI:10.1016/0039-6028(73)90389-0