Low working loss Si/4H–SiC heterojunction MOSFET with analysis of the gate-controlled tunneling effect

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Bibliographic Details
Published inJournal of Electronic Science and Technology Vol. 21; no. 4; p. 100224
Main Authors Chen, Hang, Zhang, You-Run
Format Journal Article
LanguageEnglish
Published 01.12.2023
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ISSN:1674-862X
DOI:10.1016/j.jnlest.2023.100224