Measurement method for the large-signal admittance of mounted IMPATT diodes
The procedure employs a network analyzer and a computer optimization routine. An error network is introduced to account for drift of the measurement system and a second network is used to account for the mounted-diode parasitics. The measurement method is rapid and accurate, and is especially suitab...
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Published in | IEEE transactions on instrumentation and measurement Vol. IM-30; no. 1; pp. 25 - 30 |
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Main Authors | , |
Format | Journal Article |
Language | English |
Published |
IEEE
01.03.1981
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Subjects | |
Online Access | Get full text |
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Summary: | The procedure employs a network analyzer and a computer optimization routine. An error network is introduced to account for drift of the measurement system and a second network is used to account for the mounted-diode parasitics. The measurement method is rapid and accurate, and is especially suitable when measurements are required at several frequencies. Typical large-signal admittance results, obtained for a Si IMPATT diode at several frequencies, are presented. |
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ISSN: | 0018-9456 1557-9662 |
DOI: | 10.1109/TIM.1981.6312433 |