Measurement method for the large-signal admittance of mounted IMPATT diodes

The procedure employs a network analyzer and a computer optimization routine. An error network is introduced to account for drift of the measurement system and a second network is used to account for the mounted-diode parasitics. The measurement method is rapid and accurate, and is especially suitab...

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Bibliographic Details
Published inIEEE transactions on instrumentation and measurement Vol. IM-30; no. 1; pp. 25 - 30
Main Authors Mansour, N. A., Goud, P. A.
Format Journal Article
LanguageEnglish
Published IEEE 01.03.1981
Subjects
Admittance
Frequency measurement
Impedance
Measurement uncertainty
Radio frequency
Transmission line measurements
Voltage measurement
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Summary:The procedure employs a network analyzer and a computer optimization routine. An error network is introduced to account for drift of the measurement system and a second network is used to account for the mounted-diode parasitics. The measurement method is rapid and accurate, and is especially suitable when measurements are required at several frequencies. Typical large-signal admittance results, obtained for a Si IMPATT diode at several frequencies, are presented.
ISSN:0018-9456
1557-9662
DOI:10.1109/TIM.1981.6312433