Study of crystallization from amorphous state of ferroelectric oxides by scanning probe microscopy

We applied scanning probe microscope (SPM) to study the surface nature of amorphous samples of ferroelectric oxides, Bi 4 Ti 3 O 12 and PbTiO 3 , which were prepared by rapid quenching method. Not only changes of surface topographic images but also those of surface hardness images were investigated...

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Bibliographic Details
Published inFerroelectrics Vol. 264; no. 1; pp. 185 - 190
Main Authors Takashige, Masaaki, Hamazaki, Sinichi, Takahashi, Yoshio, Shimizu, Fuminao, Kojima, Seiji, Jang, Min-Su
Format Journal Article
LanguageEnglish
Published Taylor & Francis Group 01.01.2001
Subjects
amorphous
crystallization
PbTiO
scanning probe microcopy
SPM
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Summary:We applied scanning probe microscope (SPM) to study the surface nature of amorphous samples of ferroelectric oxides, Bi 4 Ti 3 O 12 and PbTiO 3 , which were prepared by rapid quenching method. Not only changes of surface topographic images but also those of surface hardness images were investigated when samples were annealed at elevated temperatures.
ISSN:0015-0193
1563-5112
DOI:10.1080/00150190108008568