Dynamic Flash Memory with fast block refresh feature using double storage gates and one select gate
This paper proposes a Dynamic Flash Memory (DFM) (Sakui and Harada, 2020; 2021 [1,2]) with double storage gates and one select gate based on FinFET and Surrounding Gate Transistor (SGT) (Takato et al., 1988 [3]) architectures. Like DRAM (Dennard, 1967 [4]), refresh is required, but fast block refres...
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Published in | Memories - Materials, Devices, Circuits and Systems Vol. 2; p. 100007 |
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Main Authors | , |
Format | Journal Article |
Language | English |
Published |
Elsevier Ltd
01.10.2022
Elsevier |
Subjects | |
Online Access | Get full text |
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Summary: | This paper proposes a Dynamic Flash Memory (DFM) (Sakui and Harada, 2020; 2021 [1,2]) with double storage gates and one select gate based on FinFET and Surrounding Gate Transistor (SGT) (Takato et al., 1988 [3]) architectures. Like DRAM (Dennard, 1967 [4]), refresh is required, but fast block refresh improves the duty ratio. Analogous to Flash (Masuoka, 1981 [5]), three basic operations of “0” Erase, “1” Program, and Read are necessary, but the ability to carry out Read-While-Erase (RWE), and Program-While-Erase (PWE) operations in the background results in a faster system. |
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ISSN: | 2773-0646 2773-0646 |
DOI: | 10.1016/j.memori.2022.100007 |