Study of Defects in High Energy Ion Implanted ZnO Crystals
Positron annihilation spectroscopy (PAS) was employed for characterization of defects in the hydrothermally (HT) grown zinc oxide single crystals irradiated by high energy ions. Defects created in ZnO crystals by 2.5 MeV protons, 7.5 MeV N3+ and 167 MeV Xe26+ ions were compared. The virgin ZnO cryst...
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Published in | Diffusion and defect data. Solid state data. Pt. A, Defect and diffusion forum Vol. 373; pp. 193 - 196 |
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Main Authors | , , , , , , , |
Format | Journal Article |
Language | English |
Published |
Zurich
Trans Tech Publications Ltd
24.03.2017
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Subjects | |
Online Access | Get full text |
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Summary: | Positron annihilation spectroscopy (PAS) was employed for characterization of defects in the hydrothermally (HT) grown zinc oxide single crystals irradiated by high energy ions. Defects created in ZnO crystals by 2.5 MeV protons, 7.5 MeV N3+ and 167 MeV Xe26+ ions were compared. The virgin ZnO crystals contain Zn-vacancies associated with hydrogen. Ion implantation introduced additional defects, namely Zn+O di-vacancies in crystals irradiated by protons and small vacancy clusters in samples implanted by N and Xe ions. |
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Bibliography: | Selected, peer reviewed papers from the 17th International Conference on Positron Annihilation (ICPA-17), September 20-25, Wuhan, China |
ISSN: | 1012-0386 1662-9507 1662-9507 |
DOI: | 10.4028/www.scientific.net/DDF.373.193 |