Characterization of Si-SiOx nanocomposite layers by comparative analysis of computer simulated and experimental infra-red transmission spectra

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Bibliographic Details
Published inThin solid films Vol. 520; no. 6; pp. 2085 - 2091
Main Authors DONCHEV, V, NESHEVA, D, TODOROVA, D, GERMANOVA, K, VALCHEVA, E
Format Journal Article
LanguageEnglish
Published Amsterdam Elsevier 2012
Subjects
Cross-disciplinary physics: materials science; rheology
Exact sciences and technology
Materials science
Nanoscale materials and structures: fabrication and characterization
Other topics in nanoscale materials and structures
Physics
Infrared spectroscopy
Stoichiometry
Computer simulation
Density matrix
Computerized simulation
Evaporation
Infrared spectra
Stoichiometry and homogeneity
Thin films
Nanoparticles
Dielectric function
Silicon clusters
Nanocomposites
Silicon oxides
Silicon oxide
Silicon
Absorption spectra
Effective medium model
Thermal annealing
Permittivity
Nanostructured materials
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ISSN:0040-6090
1879-2731
DOI:10.1016/j.tsf.2011.08.009