Combining SEM-EDS, PIXE and XRF Techniques for Complex Analytical Problems: Depth Profile Characterization of Prehispanic Gold

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

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Bibliographic Details
Published in	Microscopy and microanalysis Vol. 17; no. S2; pp. 1776 - 1777
Main Authors	Perea, A, Fernández-Esquivel, P, Rovira-Llorens, S, Ruvalcaba-Sil, J, Verde, A, García-Vuelta, O, Cuesta-Gómez, F
Format	Journal Article
Language	English
Published	New York, USA Cambridge University Press 01.07.2011 Oxford University Press
Subjects	Microscopy and Microanalysis Applications in Cultural Heritage Research Physical Sciences
Online Access	Get full text

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Summary:	Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
ISSN:	1431-9276 1435-8115
DOI:	10.1017/S1431927611009755