Imaging Grains and Grain Boundaries in Single-Layer Graphene: An Atomic Patchwork Quilt

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

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Bibliographic Details
Published inMicroscopy and microanalysis Vol. 17; no. S2; pp. 1496 - 1497
Main Authors Huang, P, van der Zande, A, Ruiz-Vargas, C, Whitney, W, Levendorf, M, Kevek, J, Zhu, Y, Park, J, McEuen, P, Muller, D
Format Journal Article
LanguageEnglish
Published New York, USA Cambridge University Press 01.07.2011
Oxford University Press
Subjects
Chemical vapor deposition
Copper
Grain boundaries
Grain size
Graphene
Imaging and Spectroscopy of Carbon-based Nano-materials and Devices
Mechanical properties
Physical Sciences
Transmission electron microscopy
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Summary:Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
ISSN:1431-9276
1435-8115
DOI:10.1017/S143192761100835X