Imaging Analytical Studies of Old Master Paints Using FTIR, SIMS and SEMEDX of Embedded Paint Cross Sections

Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

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Bibliographic Details
Published inMicroscopy and microanalysis Vol. 11; no. S02; pp. 1370 - 1371
Main Authors Boon, J, Ferreira, E S B, Keune, K
Format Journal Article
LanguageEnglish
Published New York, USA Cambridge University Press 01.08.2005
Oxford University Press
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Summary:Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005
ISSN:1431-9276
1435-8115
DOI:10.1017/S143192760550744X