Confocal photo-stimulated microspectroscopy (CPSM) : residual stress measurements in Al2O3 using confocal microscopy

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Bibliographic Details
Published inScripta materialia Vol. 53; no. 3; pp. 347 - 349
Main Authors HOVIS, D. B, HEUER, A. H
Format Journal Article
LanguageEnglish
Published New York, NY Elsevier Science 01.08.2005
Subjects
Applied sciences
Exact sciences and technology
Metals. Metallurgy
Stress analysis
Optical spectroscopy
Thermally grown oxide (TGO)
Confocal microscopy
Residual stresses
Microstructure
Alumina
Residual stress
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ISSN:1359-6462
1872-8456
DOI:10.1016/j.scriptamat.2005.04.016