Precise estimation of dynamic junction temperature of SiC transistors for lifetime prediction of power modules used in three-phase inverters

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Bibliographic Details
Published inMicroelectronics and reliability Vol. 150; p. 115137
Main Authors Teixeira, Alice, Cougo, Bernardo, Segond, Gilles, Morais, Lenin M.F., Andrade, Marco, Tran, Duc Hoan
Format Journal Article
LanguageEnglish
Published 01.11.2023
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ISSN:0026-2714
DOI:10.1016/j.microrel.2023.115137