Perovskite Thin Films: High‐Resolution Spin‐on‐Patterning of Perovskite Thin Films for a Multiplexed Image Sensor Array (Adv. Mater. 40/2017)

A novel patterning method for perovskite thin films is developed by Dae‐Hyeong Kim and co‐workers, which is described in article number 1702902. The patterning method (spin‐on‐patterning) is based on the thermodynamically preferred dewetting behavior of the perovskite precursor solution during the s...

Full description

Saved in:
Bibliographic Details
Published inAdvanced materials (Weinheim) Vol. 29; no. 40
Main Authors Lee, Woongchan, Lee, Jongha, Yun, Huiwon, Kim, Joonsoo, Park, Jinhong, Choi, Changsoon, Kim, Dong Chan, Seo, Hyunseon, Lee, Hakyong, Yu, Ji Woong, Lee, Won Bo, Kim, Dae‐Hyeong
Format Journal Article
LanguageEnglish
Published Weinheim Wiley Subscription Services, Inc 01.10.2017
Subjects
Deformation
dewetting
Digital cameras
Drying
Formability
high‐resolution patterning
Materials science
Multiplexing
perovskite patterning
perovskite photodiode
Sensor arrays
Thin films
Online AccessGet full text

Cover

More Information
Summary:A novel patterning method for perovskite thin films is developed by Dae‐Hyeong Kim and co‐workers, which is described in article number 1702902. The patterning method (spin‐on‐patterning) is based on the thermodynamically preferred dewetting behavior of the perovskite precursor solution during the spin‐coating process. By using this method, a high‐performance, ultrathin, and deformable perovskite‐on‐silicon multiplexed image sensor array is successfully achieved.
Bibliography:ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 14
ISSN:0935-9648
1521-4095
DOI:10.1002/adma.201770288