APA (7th ed.) Citation

Schüler, N., Clausen, T., & Dornich, K. (2024). In-Line Charaterization of HPSI SiC Wafers Using High Resolution Surface Photovoltage Spectroscopy (HR-SPS). Materials science forum, 1124, 91-96. https://doi.org/10.4028/p-qatL4V

Chicago Style (17th ed.) Citation

Schüler, Nadine, Thomas Clausen, and Kay Dornich. "In-Line Charaterization of HPSI SiC Wafers Using High Resolution Surface Photovoltage Spectroscopy (HR-SPS)." Materials Science Forum 1124 (2024): 91-96. https://doi.org/10.4028/p-qatL4V.

MLA (9th ed.) Citation

Schüler, Nadine, et al. "In-Line Charaterization of HPSI SiC Wafers Using High Resolution Surface Photovoltage Spectroscopy (HR-SPS)." Materials Science Forum, vol. 1124, 2024, pp. 91-96, https://doi.org/10.4028/p-qatL4V.