Ion Implantation: Nanoporous Germanium

The formation of amorphous thin surface layers of nanoporous Ge with various morphologies during the low-energy high-dose implantation by metal ions of different masses, namely 63 Cu + , 108 Ag + , and 209 Bi + , on single-crystal c -Ge substrates was experimentally demonstrated using high-resolutio...

Full description

Saved in:
Bibliographic Details
Published inSurface investigation, x-ray, synchrotron and neutron techniques Vol. 18; no. 4; pp. 834 - 840
Main Authors Stepanov, A. L., Nuzhdin, V. I., Valeev, V. F., Rogov, A. M., Konovalov, D. A.
Format Journal Article
LanguageEnglish
Published Moscow Pleiades Publishing 01.08.2024
Springer Nature B.V
Subjects
Online AccessGet full text

Cover

Loading…
More Information
Summary:The formation of amorphous thin surface layers of nanoporous Ge with various morphologies during the low-energy high-dose implantation by metal ions of different masses, namely 63 Cu + , 108 Ag + , and 209 Bi + , on single-crystal c -Ge substrates was experimentally demonstrated using high-resolution scanning electron microscopy. The structure of the obtained nanoporous Ge layers was studied using backscattered electron diffraction. Under irradiation with low-energy ions, such as 63 Cu + and 108 Ag + , needle-like nanostructures constituting a nanoporous thin Ge layer form on the surface of c -Ge. However when employing havier 209 Bi + , the implanted layer consists of densely packed nanowires. At high ion-irradiation energies, the morphology of the thin surface layers of nanoporous Ge undergoes a sequential transformation in shape from three-dimensional reticulated to spongy as the mass of the implanted ions increased. Such a spongy structure was formed by sparse individual intertwining nanowires. The general potential mechanisms for pore formation in Ge during low-energy high-dose ion implantation are discussed, including the cluster–vacancy mechanism, local thermal microexplosion, and localized heating accompanied by surface melting with effective sputtering.
ISSN:1027-4510
1819-7094
DOI:10.1134/S1027451024700526