Double Electron Capture Probability at He2+ Ion Xe Atom Collisions with Different Impact Parameters

Differential cross sections for scattering of helium atoms formed at collisions of He 2+ ions with kinetic energies of 1.97, 3.00, and 7.17 keV/a.m.u with Xe atoms in processes with the formation of slow xenon ions with charges 2–4 have been measured. The projectiles deflection function is calculate...

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Bibliographic Details
Published inTechnical physics letters Vol. 49; no. 12; pp. 212 - 215
Main Authors Basalaev, A. A., Panov, M. N., Smirnov, O. V.
Format Journal Article
LanguageEnglish
Published Moscow Pleiades Publishing 01.12.2023
Springer Nature B.V
Subjects
Atomic collisions
Beta decay
Classical and Continuum Physics
Electron capture
Electrons
Helium atoms
Parameters
Particle physics
Physics
Physics and Astronomy
Projectiles
Scattering cross sections
Xenon
impact parameter
capture with ionization
scattering differential cross section
double electron capture
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Summary:Differential cross sections for scattering of helium atoms formed at collisions of He 2+ ions with kinetic energies of 1.97, 3.00, and 7.17 keV/a.m.u with Xe atoms in processes with the formation of slow xenon ions with charges 2–4 have been measured. The projectiles deflection function is calculated. The probability of all these processes occurring at various values of the impact parameter of colliding particles is determined. The role of the electron shells of the Xe atom 5( s , p ) and 4( s , p , d ) for the capture of two electrons is determined depending on the speed of approach of the colliding particles, the impact parameter and the charge of the formed xenon ions.
ISSN:1063-7850
1090-6533
DOI:10.1134/S1063785023900066