LEED I(V) analysis and STM of the Si(111)-Pb system

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Bibliographic Details
Published inVacuum Vol. 46; no. 8; pp. 1137 - 1138
Main Authors Jones, AH, Zhao, H, Tear, SP
Format Journal Article Conference Proceeding
LanguageEnglish
Published Oxford Elsevier Ltd 1995
Elsevier
Subjects
Applied sciences
Condensed matter: structure, mechanical and thermal properties
Exact sciences and technology
Metals. Metallurgy
Physics
Solid surfaces and solid-solid interfaces
Surface structure and topography
Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)
Semiconductor materials
Nonmetals
Lead
Silicon
Overlayers
Solid-solid interfaces
LEED
Experimental study
Thermal annealing
STM
Surface structure
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ISSN:0042-207X
1879-2715
DOI:10.1016/0042-207X(95)00124-7