Determination of the Minority Carrier Surface Thermogeneration Rate in Metal-Oxide-Semiconductor Structures

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Bibliographic Details
Published inInstruments and experimental techniques (New York) Vol. 48; no. 4; pp. 498 - 502
Main Authors Chucheva, G. V., Zhdan, A. G., Akhmedov, G. A., Kukharskaya, N. F.
Format Journal Article
LanguageEnglish
Published 01.07.2005
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ISSN:0020-4412
1608-3180
DOI:10.1007/s10786-005-0086-y