DIAGNOSIS OF SPATIAL RESOLUTION FOR MICROBEAM SCANNING PIXE USING STIM METHOD AND CR-39 TRACK DETECTOR IN PASTA

In PIXE analysis system and Tandem Accelerator facility (PASTA) of NIRS, we are using Scanning Transmission Ion Microscopy (STIM) method and solid track detector to diagnose the spatial resolution of scanning microbeam PIXE analysis system. These methods are widely used by many microbeam facilities.

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Bibliographic Details
Published inInternational journal of PIXE Vol. 13; no. 1n02; pp. 37 - 43
Main Authors Hamano, T., Imaseki, H., Yukawa, M., Ishikawa, T., Iso, H., Matsumoto, K.
Format Journal Article
LanguageEnglish
Published World Scientific Publishing Company 2003
Subjects
Direct STIM
microbeam
CR-39
PIXE
STIM
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Summary:In PIXE analysis system and Tandem Accelerator facility (PASTA) of NIRS, we are using Scanning Transmission Ion Microscopy (STIM) method and solid track detector to diagnose the spatial resolution of scanning microbeam PIXE analysis system. These methods are widely used by many microbeam facilities.
ISSN:0129-0835
1793-6616
DOI:10.1142/S0129083503000087