Frequency Modulation Atomic Force Microscopy in Ionic Liquid Using Quartz Tuning Fork Sensors

Saved in:
Bibliographic Details
Published inJapanese Journal of Applied Physics Vol. 51; no. 8S3; p. 8
Main Authors Ichii, Takashi, Fujimura, Motohiko, Negami, Masahiro, Murase, Kuniaki, Sugimura, Hiroyuki
Format Journal Article
LanguageEnglish
Japanese
Published 01.08.2012
Online AccessGet full text

Cover

More Information
ISSN:0021-4922
1347-4065
DOI:10.7567/JJAP.51.08KB08