Resistance Switching Properties of Titanium Oxide with Different Copper Electrode Structure

The reversible resistance switching (RS) effect of the Al/TiO x /Cu structure was investigated in this study. This RS is attributed to space-charge-limited conduction controlled by localized copper ions trap near the Cu electrode. Filament formation and dissolution in the Al/TiO x /Cu system were di...

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Bibliographic Details
Published inECS transactions Vol. 52; no. 1; pp. 973 - 978
Main Authors Shao, Xinglong, Zhao, Jinshi, Zhang, Kailiang, Chen, Ran, Zhou, Liwei, Chen, Changjun, Wang, Jianyun
Format Journal Article
LanguageEnglish
Published 01.01.2013
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Summary:The reversible resistance switching (RS) effect of the Al/TiO x /Cu structure was investigated in this study. This RS is attributed to space-charge-limited conduction controlled by localized copper ions trap near the Cu electrode. Filament formation and dissolution in the Al/TiO x /Cu system were discussed to compare with the Cu/TiO x /Al decice. The linear relationship between the reset current and compliance current was discussed, it shown that the method to measurement play a important role. The electrical transport mechanism during the resistance switch periods are controlled by space charge limited current (SCLC) theory.
ISSN:1938-5862
1938-6737
DOI:10.1149/05201.0973ecst