Is precession electron diffraction kinematical? Part II

• Published in: Ultramicroscopy Vol. 110; no. 7; pp. 771 - 777
• Main Authors: Eggeman, A.S., White, T.A., Midgley, P.A.
• Format: Journal Article
• Language: English
• Published: Elsevier B.V 01.06.2010
• Subjects: Angle of reflection; Diffraction; Dynamical systems; Electron diffraction; Phase retrieval; Phases; Precession; Precession electron diffraction; Reflection; Structure factor; Phase retrieval; Precession electron diffraction
• ISSN: 0304-3991; 1879-2723
• DOI: 10.1016/j.ultramic.2009.10.012

A series of experiments was undertaken to investigate the kinematical nature of precession electron diffraction data and to gauge the optimum precession angle for a particular system. Kinematically forbidden reflections in silicon were used to show how a large precession angle is needed to minimise multi-beam conditions for specific reflections and so reduce the contribution from dynamical diffraction. Small precession angles were shown to be detrimental to the kinematical nature of some low-order reflections. By varying precession angles, precession electron diffraction data for erbium pyrogermanate were used to investigate the effect of dynamical diffraction on the output from structure solution algorithms. A good correlation was noted between the precession angle at which the rate of change of relative intensities is small and the angle at which the recovered structure factor phases matched the theoretical kinematical structure factor phases.