Improving Analytical Capability via Simultaneous Voltage and Laser Pulsing in Atom Probe Tomography

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Bibliographic Details
Published inMicroscopy and microanalysis Vol. 29; no. Supplement_1; pp. 609 - 610
Main Authors Larson, David J, Prosa, Ty J, Chen, Yimeng, Reinhard, David A, Martin, Isabelle, Ulfig, Robert M, Holman, Michael, Robinson, Jesse, Lenz, Dan
Format Journal Article
LanguageEnglish
Published 22.07.2023
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ISSN:1431-9276
1435-8115
DOI:10.1093/micmic/ozad067.295