Structural Analysis Enabled by the Invizo 6000® Large Field-of-View Atom Probe

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Bibliographic Details
Published inMicroscopy and microanalysis Vol. 29; no. Supplement_1; pp. 813 - 814
Main Authors Chen, Yimeng, Martin, Isabelle, Prosa, Ty, Ulfig, Robert, Rice, Katherine P, Larson, David J, Reinhard, David A, Lenz, Dan, Brewer, Nicholas R, Holman, Michael, Hanna, Jacob, Groth, Gard, Pal, Avnish Singh, Basu, Joysurya
Format Journal Article
LanguageEnglish
Published 22.07.2023
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content type line 23
ISSN:1431-9276
1435-8115
DOI:10.1093/micmic/ozad067.404