Wide Field of View Versus High Spatial Resolution and High Sensitivity – the Advantage of Correlative Microscopies (APT, SIMS, EBSD, μXRF) for the Analysis of Minerals

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Bibliographic Details
Published inMicroscopy and microanalysis Vol. 29; no. Supplement_1; pp. 790 - 791
Main Authors Ulfig, Robert, Reddy, Steven, Saxey, David, Rickard, Will, Fougerouse, Denis, Pearce, Mark, Fisher, Louise, Kilburn, Matt, Gagliardo, Paul, Clifton, Peter H, Reinhard, David A, Larson, David J
Format Journal Article
LanguageEnglish
Published 22.07.2023
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ISSN:1431-9276
1435-8115
DOI:10.1093/micmic/ozad067.393