Evidence for self-organization processes in PbTe-Bi2Te3 semiconductor solid solutions

The dependences of unit cell parameter, x-ray diffraction line width B, and microhardness H on the composition of PbTe-Bi2Te3 (0–10 mol% Bi2Te3) semiconductor alloys, subjected to different types of heat treatment, were obtained. In the concentration ranges ∼0.5–1.5 and 3–4 mol% Bi2Te3 within the ho...

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Bibliographic Details
Published inJournal of materials research Vol. 26; no. 13; pp. 1627 - 1633
Main Authors Rogacheva, Elena, Vodorez, Olga, Pinegin, Vladimir, Nashchekina, Olga
Format Journal Article
LanguageEnglish
Published New York, USA Cambridge University Press 14.07.2011
Springer International Publishing
Springer Nature B.V
Subjects
Analysis
Applied and Technical Physics
Biomaterials
Critical phenomena
Dependence
Heat
Heat treating
Inorganic Chemistry
Materials Engineering
Materials research
Materials Science
Nanotechnology
Phase transitions
Semiconductors
Solid solutions
Solution chemistry
Studies
X-ray diffraction
Interatomic arrangements
Chemical substitution
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Summary:The dependences of unit cell parameter, x-ray diffraction line width B, and microhardness H on the composition of PbTe-Bi2Te3 (0–10 mol% Bi2Te3) semiconductor alloys, subjected to different types of heat treatment, were obtained. In the concentration ranges ∼0.5–1.5 and 3–4 mol% Bi2Te3 within the homogeneity region of PbTe (0–6 mol% Bi2Te3), anomalous constancy or decrease in B and H was observed. A long room temperature aging leads to a more distinct manifestation of these effects. It is suggested that the observed peculiarities in the concentration dependences of the properties are connected with percolation effects and self-organization processes in the solid solution.
ISSN:0884-2914
2044-5326
DOI:10.1557/jmr.2011.165