BEOL-compatible Ta/HZO/W Ferroelectric Tunnel Junction with Low Operating Voltage Targeting for Low Power Application
HfO 2 -based metal-ferroelectric-metal (MFM) ferroelectric tunnel junction (FTJ) with the low operating voltage (± 1.5 V) has been fabricated by simple process steps with a low thermal budget (≤ 450 °C). It enables a better read current level and a lower operating voltage compared with its metal-fer...
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Published in | 2022 International Conference on IC Design and Technology (ICICDT) pp. 5 - 7 |
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Main Authors | , , , , , , , , , , |
Format | Conference Proceeding |
Language | English |
Published |
IEEE
21.09.2022
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Subjects | |
Online Access | Get full text |
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Summary: | HfO 2 -based metal-ferroelectric-metal (MFM) ferroelectric tunnel junction (FTJ) with the low operating voltage (± 1.5 V) has been fabricated by simple process steps with a low thermal budget (≤ 450 °C). It enables a better read current level and a lower operating voltage compared with its metal-ferroelectric-insulator-semiconductor (MFIS) competitors, which means a reduction in the power consumption on the premise of readability. Moreover, long retention and acceptable endurance for non-volatile memory are demonstrated. With these advantages, our device shows great potential for monolithic 3D integration with the CMOS circuits in low-power storage or in-memory computing applications. |
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ISSN: | 2691-0462 |
DOI: | 10.1109/ICICDT56182.2022.9933091 |