Three ways to implement interfacial techniques: application to measurements of chromatic dispersion, birefringence, and nonlinear susceptibilities

Depending on the spectal width of the source illuminating an interferometer, measurement procedures can utilize either the whole interferogram, or only the fringe envelope, or only the fringe quick oscillations. With an ultraband spectrum source, a simplified adaptation of the methods of Fourier tra...

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Bibliographic Details
Published inJournal of lightwave technology Vol. 7; no. 3; pp. 500 - 513
Main Authors Francois, P.-L., Monerie, M., Vassallo, C., Durteste, Y., Alard, F.R.
Format Journal Article
LanguageEnglish
Published IEEE 01.03.1989
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Summary:Depending on the spectal width of the source illuminating an interferometer, measurement procedures can utilize either the whole interferogram, or only the fringe envelope, or only the fringe quick oscillations. With an ultraband spectrum source, a simplified adaptation of the methods of Fourier transform spectroscopy yields the variations of the test-fiber propagation constant over the whole wavelength-interval of the source. Chromatic dispersion can then be computed from a single interferogram. With narrower spectrum sources, only the fringe envelopes are utilized and yield measurements of mode delay, with application to chromatic and polarization mode dispersion. In this case, however, interferograms at several wavelengths are necessary. With even narrower spectrum sources, the fringe quick oscillations provide measurements of phase shifts, related to changes in the mode propagation constant, when outside perturbations are applied to the test fiber. A direct method for measuring the third-order nonlinear susceptibilities is discussed. In this case the outside perturbation is an intense pump laser field.< >
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ISSN:0733-8724
1558-2213
DOI:10.1109/50.16886