Nonlinear Characterization of Waveguide Index Profile: Application to Soft-Proton-Exchange in LiNbO 3
In integrated photonics, the precise knowledge of the waveguides refractive index profile is mandatory for the modeling of photonic chips and therefore implementing innovative circuits. Usual index profile determination relies on effective index measurement of propagating modes in planar waveguides...
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Published in | Journal of lightwave technology Vol. 39; no. 14; pp. 4695 - 4699 |
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Main Authors | , , , , , , , , , |
Format | Journal Article |
Language | English |
Published |
IEEE
01.07.2021
Institute of Electrical and Electronics Engineers (IEEE)/Optical Society of America(OSA) |
Subjects | |
Online Access | Get full text |
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