Nonlinear Characterization of Waveguide Index Profile: Application to Soft-Proton-Exchange in LiNbO 3

In integrated photonics, the precise knowledge of the waveguides refractive index profile is mandatory for the modeling of photonic chips and therefore implementing innovative circuits. Usual index profile determination relies on effective index measurement of propagating modes in planar waveguides...

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Bibliographic Details
Published inJournal of lightwave technology Vol. 39; no. 14; pp. 4695 - 4699
Main Authors Neradovskiy, Maxim, Tronche, Herve, Chezganov, Dmitry, Pashnina, Elena, Vlasov, Evgeniy, Baldi, Pascal, Lunghi, Tommaso, Shur, Vladimir, Doutre, Florent, De Micheli, Marc
Format Journal Article
LanguageEnglish
Published IEEE 01.07.2021
Institute of Electrical and Electronics Engineers (IEEE)/Optical Society of America(OSA)
Subjects
Harmonic analysis
Indexes
Mathematical model
mode matching method
Nonlinear optics
optical waveguide
Optical waveguides
Optics
Photonics
Physics
Protons
Refractive index
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Summary:In integrated photonics, the precise knowledge of the waveguides refractive index profile is mandatory for the modeling of photonic chips and therefore implementing innovative circuits. Usual index profile determination relies on effective index measurement of propagating modes in planar waveguides coupled with numerical fitting tools. In this paper we propose an alternative technique based on the characterization of the second harmonic generation signature of a nonlinear waveguide. We include the characterization of high-order spatial modes showing their relevance to probe both vertical and lateral distributions. We finally provide an explicit profile ready-to-use for modeling soft-proton exchanged waveguides in lithium niobate and we test its prediction capability.
ISSN:0733-8724
1558-2213
DOI:10.1109/JLT.2021.3077637