Pre-Meeting Congress on Opportunities, Artifacts and Interpretation of Aberration-Corrected Electron Microscopy Data

• Published in: Microscopy and microanalysis Vol. 17; no. S1; p. 20
• Main Authors: Batson, Philip, Muller, David, Allard, Lawrence, Voyles, Paul, Chi, Miofang, O'Keefe, Michael
• Format: Journal Article
• Language: English
• Published: New York, USA Cambridge University Press 01.08.2011; Oxford University Press
• Subjects: Data collection; Electron microscopy
• ISSN: 1431-9276; 1435-8115
• DOI: 10.1017/S1431927611000729

This one-day pre-meeting congress, organized by the MSA Aberration-Corrected Electron Microscopy (ACEM) FIG, will be a forum for the discussion of the latest advances and solutions to problems associated with application of aberration correction technology. There will be platform presentations by both invited and contributed speakers, with poster presentations during a working lunch. Invited speakers will introduce innovations and issues, while contributors will highlight practical experiences and solutions to problems encountered during the application of ACEM to on-going experimental studies. This workshop includes: image collection/interpretation, new spectroscopies or other signals, artifacts and practical experiences in applications of ACEM to difficult situations such as hard/soft materials and in-situ experiments. All platform presentations will be intentionally kept short (∼15–20 minutes) to allow the maximum amount of interaction and information flow among attendees. Please send one page abstracts, including figures, to batson@rutgers.edu with the subject line: M&M PMC Abstract.