Enhancements in X-ray Photoelectron Spectroscopy for Improved Materials Characterization

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

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Bibliographic Details
Published in	Microscopy and microanalysis Vol. 12; no. S02; pp. 118 - 119
Main Author	Surman, D
Format	Journal Article
Language	English
Published	New York, USA Cambridge University Press 01.08.2006 Oxford University Press
Subjects	Surface Microscopy and Microanalysis in Materials and Biological Systems
Online Access	Get full text

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Summary:	Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005
ISSN:	1431-9276 1435-8115
DOI:	10.1017/S1431927606068115