Current and Future Developments in order to Approach a Point Resolution of dpr ~ 0.5 Å with a TEM

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Bibliographic Details
Published inMicroscopy and microanalysis Vol. 9; no. S02; pp. 930 - 931
Main Author Haider, Max
Format Journal Article
LanguageEnglish
Published New York, USA Cambridge University Press 01.08.2003
Oxford University Press
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ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927603444656