Quantifying Heterogeneity in the Pu-Ga System

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

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Bibliographic Details
Published inMicroscopy and microanalysis Vol. 10; no. S02; pp. 906 - 907
Main Authors Davis, C C, Lakis, R E
Format Journal Article
LanguageEnglish
Published New York, USA Cambridge University Press 01.08.2004
Oxford University Press
Subjects
Heterogeneity
Quantitative X-ray Microanalysis
Standard deviation
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Summary:Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.
ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927604882552