Temporal pattern attention based Hammerstein model for estimating battery SOC

A temporal pattern attention based Hammerstein model (TPA-H) is adopted to estimate the state of charge (SOC) of lithium-ion batteries. The proposed Hammerstein system consists of a special temporal pattern attention (TPA) nonlinear block followed by a dynamic controlled auto-regressive moving avera...

Full description

Saved in:
Bibliographic Details
Published inJournal of energy storage Vol. 100; p. 113666
Main Authors Hu, Haiyang, Xie, Zengkun, Wang, Dongqing
Format Journal Article
LanguageEnglish
Published Elsevier Ltd 20.10.2024
Subjects
Online AccessGet full text

Cover

Loading…
More Information
Summary:A temporal pattern attention based Hammerstein model (TPA-H) is adopted to estimate the state of charge (SOC) of lithium-ion batteries. The proposed Hammerstein system consists of a special temporal pattern attention (TPA) nonlinear block followed by a dynamic controlled auto-regressive moving average (CARMA) linear block. The content includes: 1) By sliding window based TPA, exerting different attentions on input series generates current signal vectors as the input of the linear part; 2) By the hierarchical identification principle, the system is recasted into four fictitious models, each model contains different parameter vectors/matrices; 3) By the N-Adam optimization algorithm and the hierarchical identification principle, the four model parameters are interactively optimized; 4) In the simulation, four different temperatures of 25 °C, 10 °C, 0 °C and − 10 °C under the US06 working condition are considered. The simulation results show that the TPA-H model has good performance under the US06 condition. •TPA exerting different attention on input series generates current signal vectors•By hierarchical identification principle, the system is recasted into four fictitious models•By N-Adam algorithm, four model parameters are interactively optimized•In the simulation, four different temperatures under US06 condition are considered
ISSN:2352-152X
DOI:10.1016/j.est.2024.113666