Application of photogrammetric methods in architecture, construction and land management
Abstract One of the important tasks is the photogrammetry application study in construction with the aim, namely, to determine the engineering structures‘ deformations, to study the engineering structures‘ models and to solve other problems. With the use of modern technologies, it is possible to mak...
Saved in:
Published in | IOP conference series. Materials Science and Engineering Vol. 1083; no. 1; p. 12052 |
---|---|
Main Authors | , , , , |
Format | Journal Article |
Language | English |
Published |
Bristol
IOP Publishing
01.02.2021
|
Subjects | |
Online Access | Get full text |
Cover
Loading…
Summary: | Abstract
One of the important tasks is the photogrammetry application study in construction with the aim, namely, to determine the engineering structures‘ deformations, to study the engineering structures‘ models and to solve other problems. With the use of modern technologies, it is possible to make photogrammetric surveys of buildings and structures using certain methods of performing these works. Photogrammetry plays a significant role not only in architecture, construction and land management. Photogrammetric methods make it possible to solve some applied problems directly from the images economically and fairly accurately, for example, to measure the terrain areas, determine their slopes, obtain quantitative characteristics of erosion processes, and perform vertical planning with the determination of the earthwork amount. In the article, the main goal is to consider the implementation of architectural and construction measurements for the purpose of reconstruction and restoration of buildings, as well to complete visualization of the area of interest, performed using photogrammetric methods on the basis of aerial photographs. The analysis made allows us to conclude that both classical and modern digital photogrammetry can be used in architecture, construction and land management. |
---|---|
ISSN: | 1757-8981 1757-899X |
DOI: | 10.1088/1757-899X/1083/1/012052 |