A Systematic Approach to Adaptive Mesh Refinement for Computational Electrodynamics
There is a great need to solve CED problems on adaptive meshes; referred to here as AMR-CED. The problem was deemed to be susceptible to "long-term instability" and parameterized methods have been used to control the instability. In this paper, we present a new class of AMR-CED methods tha...
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Published in | IEEE journal on multiscale and multiphysics computational techniques Vol. 8; pp. 82 - 96 |
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Main Authors | , |
Format | Journal Article |
Language | English |
Published |
Piscataway
IEEE
2023
The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subjects | |
Online Access | Get full text |
ISSN | 2379-8815 2379-8815 |
DOI | 10.1109/JMMCT.2022.3233944 |
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Summary: | There is a great need to solve CED problems on adaptive meshes; referred to here as AMR-CED. The problem was deemed to be susceptible to "long-term instability" and parameterized methods have been used to control the instability. In this paper, we present a new class of AMR-CED methods that are free of this instability because they are based on a more careful understanding of the constraints in Maxwell's equations and their preservation on a single control volume. The important building blocks of these new methods are: 1) Timestep sub-cycling of finer child meshes relative to parent meshes. 2) Restriction of fine mesh facial data to coarser meshes when the two meshes are synchronized in time. 3) Divergence constraint-preserving prolongation of the coarse mesh solution to newly built fine meshes or to the ghost zones of pre-existing fine meshes. 4) Electric and magnetic field intensity-correction strategy at fine-coarse interfaces. Using examples, we show that the resulting AMR-CED algorithm is free of "long-term instability". Unlike previous methods, there are no adjustable parameters. The method is inherently stable because a strict algorithmic consistency is applied at all levels in the AMR mesh hierarchy. We also show that the method preserves order of accuracy, so that high order methods for AMR-CED are indeed possible. |
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Bibliography: | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 14 |
ISSN: | 2379-8815 2379-8815 |
DOI: | 10.1109/JMMCT.2022.3233944 |