Reliability of All Possible Series-Parallel Redundant Structures of M I.I.D. Units with Two Failure Modes

The paper presents a method for generating systematically and exactly all possible series-parallel (s-p) structures for several i.i.d. units. The method is modified in order to calculate the failure probabilities and reliabilities of all the possible s-p redundant structures for the i.i.d. units wit...

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Bibliographic Details
Published inIEEE transactions on reliability Vol. R-29; no. 4; pp. 320 - 323
Main Authors Nakagawa, Yuji, Hattori, Yoshio
Format Journal Article
LanguageEnglish
Published IEEE 01.10.1980
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Summary:The paper presents a method for generating systematically and exactly all possible series-parallel (s-p) structures for several i.i.d. units. The method is modified in order to calculate the failure probabilities and reliabilities of all the possible s-p redundant structures for the i.i.d. units with two failure modes. Included is an example of finding an optimal s-p redundant structure subject to four constraints for reliability (two for failure probabilities and two for fail-safe).
ISSN:0018-9529
DOI:10.1109/TR.1980.5220853