Direct observation of charged state in C 60 -based field-effect transistor using operando photoelectron yield spectroscopy

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Bibliographic Details
Published inApplied physics express Vol. 11; no. 8; p. 81601
Main Authors Tanaka, Yuya, Ikegami, Keitaro, Maruyama, Taichi, Kinjo, Hiroumi, Ishii, Hisao
Format Journal Article
LanguageEnglish
Published 01.08.2018
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ISSN:1882-0778
1882-0786
DOI:10.7567/APEX.11.081601