An integrated and versatile QXAFS system for general XAFS beamlines

• Published in: Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment Vol. 1042; p. 167428
• Main Authors: Zhang, Guikai, Zhou, Jia, Yang, Fengfan, Chu, Shengqi, Zhang, Hongyu, Chang, Jinfan, Xu, Wenjie, Hu, Tiandou, Zhang, Jing
• Format: Journal Article
• Language: English
• Published: Elsevier B.V 01.11.2022
• Subjects: FPGA; Large data processing; QXAFS; Time resolved XAFS; QXAFS; Time resolved XAFS; FPGA; Large data processing
• ISSN: 0168-9002; 1872-9576
• DOI: 10.1016/j.nima.2022.167428

An integrated quick-scanning X-ray absorption fine structure (QXAFS) system has been developed for general XAFS beamlines with double-crystal monochromator to conduct time resolved researches. Based on the field programmable gate array (FPGA), it is flexible to adopt the programming control of both the motion of monochromator and data acquisition, and also synchronize with other devices by trigger signals. By scanning the monochromator quickly and periodically, it can achieve a time resolution of a few seconds, which is just limited by the top speed of motor, not the system itself. The system is designed to be compact and transferable into other similar XAFS beamlines, aiming to make good use of the beamline’s ability at a minimum cost. On the other hand, a large amount of data generated in the experiments is a great challenge to users. A program also has been developed to help users extract key information from the dynamic process. It is successfully applied in the operando electrocatalytic process by cooperating with the electrochemical workstation, showing a good performance. The QXAFS system offers a perfect and cost-effective choice for general XAFS beamlines to obtain high quality data with a moderate time resolution, and also to be versatile in terms of connecting with other devices for joint measurements, improving the experiment efficiency with auto sample changer, reducing the radiation damage on samples, and so on.