Cyclic shift short-distance attention for defect detection of fine etching mesh

• Published in: Engineering Research Express Vol. 6; no. 4; pp. 45002 - 45015
• Main Authors: Zou, Yuehao, Long, Shengrong, Li, Zhinong, Chen, Faqiang
• Format: Journal Article
• Language: English
• Published: IOP Publishing 01.12.2024
• Subjects: cyclic shift long short distance attention; multi-feature fusion pyramid network; tracking position bias

Abstract Based on the deficiency of the existing Swin Transformer in the detection of surface defects in metal etched grids, i.e. the isolation of information transmission between different windows, and the limitations of image matrix size and network structure,which make it not suitable for long se...