Cyclic shift short-distance attention for defect detection of fine etching mesh

• Published in: Engineering Research Express Vol. 6; no. 4; pp. 45002 - 45015
• Main Authors: Zou, Yuehao, Long, Shengrong, Li, Zhinong, Chen, Faqiang
• Format: Journal Article
• Language: English
• Published: IOP Publishing 01.12.2024
• Subjects: cyclic shift long short distance attention; multi-feature fusion pyramid network; tracking position bias
• ISSN: 2631-8695; 2631-8695
• DOI: 10.1088/2631-8695/ad82a0

Abstract Based on the deficiency of the existing Swin Transformer in the detection of surface defects in metal etched grids, i.e. the isolation of information transmission between different windows, and the limitations of image matrix size and network structure,which make it not suitable for long sequence data processing and dense prediction scenarios, a defect detection method for metal etching nets based on Cyclic shift Long Short Distance Attention (C-LSDA) is proposed. In the proposed method, cross-scale features are used to capture long and short distance relationships,and enhance the feature transfer between windows. Tracking position bias (TPB) is also used to improve relative position bias (RPB), in order to help the model to better understand the spatial relationships in the input data. In addition, the image is downsampled at various scales, so that the proposed method can be suitable for long sequence data processing and dense prediction scenarios. In order to improve the detection accuracy of small targets. a multi-feature fusion pyramid network (MFFPN) for feature fusion is also proposed. The experimental results show that the proposed method is significantly superior to the traditional CNN recognition method and the transformer recognition method. The proposed methodhas good identification accuracy and low computational cost.